[1]
|
Snavely N, Seitz S M, Szeliski R. Photo tourism: exploring photo collections in 3D. ACM Transactions on Graphics, 2006, 25(3): 835-846
|
[2]
|
[2] Furukawa Y, Ponce J. Accurate, dense, and robust multiview stereopsis. IEEE Transactions on Pattern Analysis and Machine Intelligence, 2010, 32(8): 1362-1376
|
[3]
|
[3] Snavely N, Seitz S M, Szeliski R. Modeling the world from internet photo collections. International Journal of Computer Vision, 2008, 80(2): 189-210
|
[4]
|
[4] Werner T, Zisserman A. New techniques for automated architectural reconstruction from photographs. In: Proceedings of the 7th European Conference on Computer Vision. London, UK: Springer-Verlag, 2002. 541-555
|
[5]
|
[5] Aider O A, Hoppenot P, Colle E. A model-based method for indoor mobile robot localization using monocular vision and straight-line correspondences. Robotics and Autonomous Systems, 2005, 52(2-3): 229-246
|
[6]
|
[6] Fan B, Wu F C, Hu Z Y. Robust line matching through line-point invariants. Pattern Recognition, 2012, 45(2): 794-805
|
[7]
|
[7] Bay H, Ferraris V, Van Gool L. Wide-baseline stereo matching with line segments. In: Proceedings of the 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition. Washington DC, USA: IEEE, 2005. 329-336
|
[8]
|
[8] Wang Z H, Wu F C, Hu Z Y. Msld: a robust descriptor for line matching. Pattern Recognition, 2009, 42(5): 941-953
|
[9]
|
[9] Lpez J, Fucios M, Fdez-Vidal X R, Pardo X M. Detection and matching of lines for close-range photogrammetry. In: Proceedings of the 6th Iberian Conference on Pattern Recognition and Image Analysis. Madeira, Portugal: Springer, 2013. 732-739
|
[10]
|
Wang L, Neumann U, You S. Wide-baseline image matching using line signatures. In: Proceedings of the 12th IEEE International Conference on Computer Vision. Kyoto, Japan: IEEE, 2009. 1311-1318
|
[11]
|
Zhang L L, Koch R. An efficient and robust line segment matching approach based on LBD descriptor and pairwise geometric consistency. Journal of Visual Communication and Image Representation, 2013, 24(7): 794-805
|
[12]
|
Schmid C, Zisserman A. Automatic line matching across views. In: Proceedings of the 1997 IEEE Computer Society Conference on Computer Vision and Pattern Recognition. San Juan, Puerto Rico: IEEE, 1997. 666-671
|
[13]
|
Schmid C, Zisserman A. The geometry and matching of lines and curves over multiple views. International Journal of Computer Vision, 2000, 40(3): 199-233
|
[14]
|
Heuel S, Frstner W. Matching, reconstructing and grouping 3d lines from multiple views using uncertain projective geometry. In: Proceedings of the 2001 IEEE Computer Society Conference on Computer Vision and Pattern Recognition. Kauai, USA: IEEE, 2001. II517-II524
|
[15]
|
Elaksher A F. Automatic line matching across multiple views based on geometric and radiometric properties. Applied Geomatics, 2011, 3(1): 23-33
|
[16]
|
Hartley R I, Zisserman A. Multiple View Geometry in Computer Vision (2nd edition). Cambridge: Cambridge University Press, 2004. 321-323
|
[17]
|
Xiao J X, Fang T, Tan P, Zhao P, Ofek E, Quan L. Image-based facade modeling. ACM Transactions on Graphics, 2008, 27(5): Article No. 161
|
[18]
|
Chen T W, Wang Q. 3d line segment detection for unorganized point clouds from multi-view stereo. In: Proceedings of the 10th Asian conference on Computer vision. Queenstown, New Zealand: Springer-Verlag, 2010. 400-411
|
[19]
|
Sander J, Ester M, Kriegel H P, Xu X W. Density-based clustering in spatial databases: the algorithm GDBSCAN and its applications. Data Mining and Knowledge Discovery, 1998, 2(2): 169-194
|
[20]
|
Saerens M, Fouss F, Yen L, Dupont P. The principal components analysis of a graph, and its relationships to spectral clustering. In: Proceedings of the 15th European Conference on Machine Learning. Pisa, Italy: Springer-Verlag, 2004. 371-383
|
[21]
|
Daszykowski M, Walczak B, Massart D L. Looking for natural patterns in data: Part 1. Density-based approach. Chemometrics and Intelligent Laboratory Systems, 2001, 56(2): 83-92
|
[22]
|
Canny J. A computational approach to edge detection. IEEE Transactions on Pattern Analysis and Machine Intelligence, 1986, 8(6): 679-698
|