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基于动态视觉传感器的铝基盘片表面缺陷检测

马居坡 陈周熠 吴金建

马居坡, 陈周熠, 吴金建. 基于动态视觉传感器的铝基盘片表面缺陷检测. 自动化学报, 2024, 50(12): 2407−2419 doi: 10.16383/j.aas.c240307
引用本文: 马居坡, 陈周熠, 吴金建. 基于动态视觉传感器的铝基盘片表面缺陷检测. 自动化学报, 2024, 50(12): 2407−2419 doi: 10.16383/j.aas.c240307
Ma Ju-Po, Chen Zhou-Yi, Wu Jin-Jian. Dynamic vision sensor based defect detection for the surface of aluminum disk. Acta Automatica Sinica, 2024, 50(12): 2407−2419 doi: 10.16383/j.aas.c240307
Citation: Ma Ju-Po, Chen Zhou-Yi, Wu Jin-Jian. Dynamic vision sensor based defect detection for the surface of aluminum disk. Acta Automatica Sinica, 2024, 50(12): 2407−2419 doi: 10.16383/j.aas.c240307

基于动态视觉传感器的铝基盘片表面缺陷检测

doi: 10.16383/j.aas.c240307 cstr: 32138.14.j.aas.c240307
基金项目: 国家重点研发计划(2023YFA1008500), 陕西省自然科学基础研究计划(2024JC-YBQN-0627), 中央高校基本科研业务费专项资金(XJSJ23079, ZYTS24006)资助
详细信息
    作者简介:

    马居坡:西安电子科技大学人工智能学院讲师. 主要研究方向为仿生动态视觉处理和视觉缺陷检测. E-mail: majupo@xidian.edu.cn

    陈周熠:西安电子科技大学人工智能学院博士研究生. 主要研究方向为仿生动态视觉处理和视觉缺陷检测. E-mail: chenzhouyi@stu.xidian.edu.cn

    吴金建:西安电子科技大学人工智能学院教授. 主要研究方向为高质量成像和图像智能处理. 本文通信作者. E-mail: jinjian.wu@mail.xidian.edu.cn

Dynamic Vision Sensor Based Defect Detection for the Surface of Aluminum Disk

Funds: Supported by National Key Research and Development Program of China (2023YFA1008500), Natural Science Basic Research Program of Shaanxi (2024JC-YBQN-0627), and the Fundamental Research Funds for the Central Universities (XJSJ23079, ZYTS24006)
More Information
    Author Bio:

    MA Ju-Po Lecturer at the School of Artificial Intelligence, Xidian University. His research interest covers bionic dynamic vision processing and visual defect detection

    CHEN Zhou-Yi Ph.D. candidate at the School of Artificial Intelligence, Xidian University. His research interest covers bionic dynamic vision processing and visual defect detection

    WU Jin-Jian Professor at the School of Artificial Intelligence, Xidian University. His research interest covers high-quality imaging and intelligent image processing. Corresponding author of this paper

  • 摘要: 现有视觉缺陷检测技术通常基于传统电荷耦合器件(Charge-coupled device, CCD)或互补金属氧化物半导体(Complementary metal-oxide-semiconductor, CMOS)相机进行缺陷成像和后端检测算法开发. 然而, 现有技术存在成像速度慢、动态范围小、背景干扰大等问题, 难以实现对高反光产品表面弱小瑕疵的快速检测. 针对上述挑战, 创新性地提出了一套基于动态视觉传感器(Dynamic vision sensor, DVS)的缺陷检测新模式, 以实现对具有高反光特性的铝基盘片表面缺陷的高效检测. DVS是一种新型的仿生视觉传感器, 具有成像速度快、动态范围大、运动目标捕捉能力强等优势. 首先开展了面向铝基盘片高反光表面弱小瑕疵的DVS成像实验, 并分析总结了DVS缺陷成像的特性与优势. 随后, 构建了第一个基于DVS的缺陷检测数据集(Event-based defect detection dataset, EDD-10k), 包含划痕、点痕、污渍三类常见缺陷类型. 最后, 针对缺陷形态多变、纹理稀疏、噪声干扰等问题, 提出了一种基于时序不规则特征聚合框架的DVS缺陷检测算法(Temporal irregular feature aggregation framework for event-based defect detection, TIFF-EDD), 实现对缺陷目标的有效检测.
    1)  11 1微米 = 10000
    2)  32 由于在事件可视化时采用了同样大小的时间窗口, 快速运动的目标会产生更多的事件. 因此, 图6(c)比图6(a)具有更粗的边缘或拖影.
    3)  23 某些缺陷盘片表面可能同时具有多种缺陷, 因此表1中不同类别的总事件流数量相加之后大于116.
  • 图  1  DVS缺陷成像机理说明

    Fig.  1  Explanation of the mechanism of DVS-based defect imaging

    图  2  事件产生数量与光强变化大小的关系示意图

    Fig.  2  Relationship diagram between the number of generated events and the magnitude of light intensity variations

    图  3  缺陷检测实验平台示意图

    Fig.  3  Diagram of the defect detection experimental platform

    图  4  弱小缺陷、环境倒影的成像效果对比

    Fig.  4  Comparison of imaging effects of small defects and environmental reflections

    图  5  大动态范围成像效果对比

    Fig.  5  Comparison of high dynamic range imaging effects

    图  6  在不同运动速度下的缺陷成像效果对比

    Fig.  6  Comparison of defect imaging effects under different motion speeds

    图  7  不同缺陷类别的事件图像以及标注框的可视化结果 ((a)点痕; (b)划痕; (c)污渍)

    Fig.  7  Visualization results of event images and annotation boxes for different defect categories ((a) Point; (b) Scratch; (c) Stain)

    图  8  数据集EDD-10k 统计特性

    Fig.  8  Statistical characteristics of the EDD-10k dataset

    图  9  缺陷检测器的主要网络框架

    Fig.  9  Main network framework of the defect detector

    图  10  基于决策级时序预测融合的后处理模块工作流程图

    Fig.  10  The workflow diagram of the post-processing module based on decision-level temporal prediction fusion

    表  1  事件流在训练集和测试集中的数量分布

    Table  1  Quantity distribution of event streams in the training set and testing set

    类别事件流总数训练集事件流数量测试集事件流数量
    点痕35278
    划痕39309
    污渍443410
    合格422
    下载: 导出CSV

    表  2  EDD-10k数据集中每一类缺陷标签的数量

    Table  2  The number of labels for each defect category in the EDD-10k dataset

    类别 事件流总数 训练集事件流数量 测试集事件流数量
    点痕 2865 2381 484
    划痕 2159 1781 378
    污渍 4070 3060 1010
    合格 9094 7222 1872
    下载: 导出CSV

    表  3  与其他算法在EDD-10k数据集上的对比实验

    Table  3  Comparison experiments with other algorithms on the EDD-10k dataset

    方法mAP@0.4AP@点痕AP@划痕AP@污渍
    Faster R-CNN[41]0.2100.0000.5360.095
    YOLOv50.5690.3930.7560.559
    YOLOv7[42]0.5430.4710.6440.514
    RDN[47]0.5120.5530.4760.507
    MEGA[48]0.4010.3560.5090.349
    YOLOV[49]0.5370.1120.6280.670
    SSD-event[40]0.2360.0870.6260.138
    SODformer-event[25]0.3940.3630.1610.495
    TIFF-EDD0.6170.5120.7010.639
    下载: 导出CSV

    表  4  在EDD-10k数据集上的消融实验结果

    Table  4  Ablation experimental results on the EDD-10k dataset

    基线MIFECTAAVFLossDPFmAP@0.4
    TIFF-B$\checkmark$0.577
    TIFF-MIFE$\checkmark$$\checkmark$0.590
    TIFF-CTAA$\checkmark$$\checkmark$$\checkmark$0.607
    TIFF-VF$\checkmark$$\checkmark$$\checkmark$$\checkmark$0.612
    TIFF-EDD$\checkmark$$\checkmark$$\checkmark$$\checkmark$$\checkmark$0.617
    下载: 导出CSV
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  • 收稿日期:  2024-06-03
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