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基于自适应全局定位算法的带钢表面缺陷检测

王延舒 余建波

王延舒, 余建波. 基于自适应全局定位算法的带钢表面缺陷检测. 自动化学报, 2024, 50(8): 1550−1564 doi: 10.16383/j.aas.c210467
引用本文: 王延舒, 余建波. 基于自适应全局定位算法的带钢表面缺陷检测. 自动化学报, 2024, 50(8): 1550−1564 doi: 10.16383/j.aas.c210467
Wang Yan-Shu, Yu Jian-Bo. Strip surface defect detection based on adaptive global localization algorithm. Acta Automatica Sinica, 2024, 50(8): 1550−1564 doi: 10.16383/j.aas.c210467
Citation: Wang Yan-Shu, Yu Jian-Bo. Strip surface defect detection based on adaptive global localization algorithm. Acta Automatica Sinica, 2024, 50(8): 1550−1564 doi: 10.16383/j.aas.c210467

基于自适应全局定位算法的带钢表面缺陷检测

doi: 10.16383/j.aas.c210467
基金项目: 国家重点研发计划 (2022YFF0605700), 国家自然科学基金(92167107), 中央高校基本业务经费项目(22120220575)资助
详细信息
    作者简介:

    王延舒:同济大学机械与能源工程学院硕士研究生. 2020年获四川大学学士学位. 主要研究方向为机器学习, 深度学习, 视觉检测与识别. E-mail: 2030211@tongji.edu.cn

    余建波:同济大学机械与能源工程学院教授. 2009年获上海交通大学博士学位. 主要研究方向为机器学习, 深度学习, 智能质量管控, 过程控制, 视觉检测与识别. 本文通信作者. E-mail: jbyu@tongji.edu.cn

Strip Surface Defect Detection Based on Adaptive Global Localization Algorithm

Funds: Supported by National Key Research and Development Program of China (2022YFF0605700), National Natural Science Foundation of China (92167107), and Fundamental Research Funds for the Central Universities (22120220575)
More Information
    Author Bio:

    WANG Yan-Shu Master student at the School of Mechanical Engineering, Tongji University. He received his bachelor degree from Sichuan University in 2020. His research interest covers machine learning, deep learning, and visual visual inspection and identification

    YU Jian-Bo Professor at the School of Mechanical Engineering, Tongji University. He received his Ph.D. degree from Shanghai Jiao Tong University in 2009. His research interest covers machine learning, deep learning, intelligent quality control, process control, and visual inspection and identification. Corresponding author of this paper

  • 摘要: 针对热轧带钢表面缺陷检测存在的智能化水平低、检测精度低和检测速度慢等问题, 提出了一种基于自适应全局定位网络(Adaptive global localization network, AGLNet)的深度学习缺陷检测算法. 首先, 引入一种残差网络(Residual network, ResNet)与特征金字塔网络(Feature pyramid network, FPN)集成的特征提取结构, 减少缺陷语义信息在层级传递间的消失; 其次, 提出基于TPE (Tree-structure Parzen estimation)的自适应树型候选框提取网络(Adaptive tree-structure region proposal extraction network, AT-RPN), 无需先验知识的积累, 避免了人为调参的训练模式; 最后, 引入全局定位回归算法, 以全局定位的模式在复杂的缺陷检测中实现缺陷更精确定位. 本文实现一种快速、准确、更智能化、更适用于实际应用的热轧带钢表面缺陷的算法. 实验结果表明, AGLNet在NEU-DET热轧带钢表面缺陷数据集上的检测速度保持在11.8帧/s, 平均精度达到79.90 %, 优于目前其他深度学习带钢表面缺陷检测算法. 另外, 该算法还具备较强的泛化能力.
  • 图  1  AGLNet结构

    Fig.  1  The structure of AGLNet

    图  2  TPE自适应Anchor-ratio调节模块流程图

    Fig.  2  Flow chart of TPE adaptive anchor-ratio adjustment module

    图  3  AT-RPN整体结构图

    Fig.  3  Whole structure of AT-RPN

    图  4  AGLNet与Faster R-CNN和Grid R-CNN的比较

    Fig.  4  Comparison of AGLNet with Faster R-CNN and Grid R-CNN

    图  5  NEU-DET数据集热轧带钢表面缺陷

    Fig.  5  Surface defects of hot rolled strip in NEU-DET dataset

    图  6  AGLNet模型下裂纹和压入氧化缺陷检测结果与人工标注位置对比

    Fig.  6  Comparison between inspection results of crazing and rolled-in_scale defects under AGLNet model and manually marked positions

    图  7  AT-RPN、RPN和AABO的分类损失函数变化对比

    Fig.  7  The change of classification loss function of AT-RPN, RPN and AABO

    图  8  AT-RPN、RPN 和 AABO的位置回归损失函数变化对比

    Fig.  8  The change of location regression loss function of AT-RPN, RPN and AABO

    图  9  PCB-Master 数据集中的高宽比统计结果

    Fig.  9  Statistical results of aspect ratio in PCB-Master dataset

    图  10  PCB-Master 检测结果

    Fig.  10  PCB-Master test results

    表  1  各个模型在NEU-DET数据集的缺陷检测平均精度结果(%)

    Table  1  The average precision results of defect detection for each model in the NEU-DET dataset (%)

    方法 平均精度均值 裂纹 夹杂 斑块 麻点 压入氧化 划痕
    Faster R-CNN 79.20 71.31 84.63 82.92 80.17 80.31 75.87
    RetinaNet 75.36 53.02 78.74 93.33 91.37 62.21 73.49
    FCOS 75.18 52.41 75.03 91.48 84.85 62.86 84.43
    Grid R-CNN 73.14 41.52 78.68 86.23 86.47 59.74 86.21
    YOLO-v1 62.90 42.35 63.42 68.23 66.49 69.37 67.53
    YOLO-v2 66.53 47.35 70.47 72.23 65.82 65.49 77.84
    YOLO-v3 69.40 68.39 61.88 71.44 68.33 72.66 73.71
    YOLO-v4 77.99 64.87 70.84 93.24 83.83 69.52 85.63
    YOLO-v5 76.82 62.42 75.76 84.23 81.27 64.59 92.63
    YOLOF 77.32 63.48 71.82 90.56 85.21 64.24 88.63
    AGLNet 79.90 54.72 83.31 88.63 91.67 64.42 96.64
    下载: 导出CSV

    表  2  AGLNet、Grid R-CNN and Faster R-CNN基于NEU-DET数据集的对比测试结果

    Table  2  Comparison results of AGLNet, Grid R-CNN and Faster R-CNN based on NEU-DET dataset

    裂纹 夹杂 斑块 麻点 压入氧化 划痕
    AGLNet
    Grid R-CNN
    Faster R-CNN
    下载: 导出CSV

    表  3  各模型FLOPs, Params和FPS对比结果

    Table  3  Comparison of FLOPs, Params and FPS of each model

    方法 FLOPs (GMAC) Params (M) FPS (帧/s)
    Faster R-CNN 408.36 98.25 ~8.2
    RetinaNet 239.32 37.74 ~12.3
    FCOS 438.68 89.79 ~9.3
    Grid R-CNN 329.51 64.32 ~10.2
    YOLO-v3 89.45 27.84 ~15.4
    YOLOF 151.47 63.24 ~13.4
    AGLNet 273.95 79.80 ~1.8
    下载: 导出CSV

    表  4  各类缺陷在不同IoU阈值下的测试结果

    Table  4  Detection results of various defects under different IoU thresholds

    IoU阈值 缺陷类型 gts Dets Recall mAP
    IoU0.5 裂纹 139 1 886 0.935 54.72
    IoU0.75 裂纹 139 1 823 0.923 47.48
    IoU0.5 夹杂 181 1 188 0.945 83.31
    IoU0.75 夹杂 181 1 163 0.932 82.17
    IoU0.5 斑块 151 627 0.960 88.63
    IoU0.75 斑块 151 591 0.942 89.45
    IoU0.5 麻点 88 689 0.955 91.67
    IoU0.75 麻点 88 636 0.938 89.24
    IoU0.5 压入氧化 126 1 034 0.893 64.42
    IoU0.75 压入氧化 126 1 051 0.882 59.66
    IoU0.5 划痕 117 317 0.991 96.64
    IoU0.75 划痕 117 322 0.986 92.79
    IoU0.5 全部缺陷 802 5 741 0.947 79.90
    IoU0.75 全部缺陷 802 5 586 0.934 76.79
    下载: 导出CSV

    表  5  消融实验结果

    Table  5  Results of ablation experiments

    序号 ResNet50_FPN ResNet50 AT-RPN RPN mAP (%) FPS GPU 存贮占用量(MiB)
    1 79.90 11.8 5568
    2 78.64 10.3 7039
    3 77.97 12.2 5024
    4 76.82 10.6 6436
    下载: 导出CSV

    表  6  消融实验对比结果

    Table  6  Comparison results of ablation experiments

    序号 对比实验 mAP提升(%) FPS提升 节约显存占用率(%)
    1 实验1/实验2 1.26 1.5 20.89
    2 实验3/实验4 1.15 1.6 21.93
    3 实验1/实验3 1.93 −0.4 −10.82
    4 实验2/实验4 1.82 −0.3 −9.36
    5 实验1/实验4 3.08 1.2 13.49
    下载: 导出CSV

    表  7  PCB-Master数据集基本信息

    Table  7  Basic information of PCB-Master dataset

    缺陷类型图像数量缺陷数量
    漏孔115497
    鼠咬115492
    断路115482
    短路115491
    毛刺115488
    余铜116503
    全部缺陷总计6932 953
    下载: 导出CSV

    表  8  各个模型在PCB-Master数据集上测试结果

    Table  8  Test results of each model on PCB-Master dataset

    Faster R-CNNRetinaNetFCOSGrid R-CNNYOLO-v3YOLOFAGLNet
    AP (漏孔) (%)87.4391.5490.7395.5585.8394.2299.45
    AP (鼠咬) (%)84.9090.5085.2493.3779.2593.3595.17
    AP (断路) (%)86.1589.6584.7491.4574.7388.6392.93
    AP (短路) (%)89.4592.1692.8399.7083.2399.7099.70
    AP (毛刺) (%)86.9195.2691.5095.3682.6298.8699.65
    AP (余铜) (%)86.5387.4888.0390.4873.1095.3994.22
    mAP (%)86.9091.1088.8594.3279.7995.0396.85
    FPS (帧/s)~4.20~6.67~5.41~5.88~9.52~7.69~6.25
    下载: 导出CSV

    表  9  PCB-Master测试集检测数据统计

    Table  9  Data statistics of PCB-Master defect detection test set

    缺陷类别 gts Dets Recall AP
    漏孔 169 696 0.998 0.995
    鼠咬 142 665 0.990 0.952
    断路 142 667 0.990 0.929
    短路 132 590 1.000 0.997
    毛刺 143 687 1.000 0.997
    余铜 137 644 0.979 0.942
    全部缺陷总计 865 3949
    下载: 导出CSV
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  • 收稿日期:  2021-05-28
  • 录用日期:  2021-11-26
  • 网络出版日期:  2023-02-06
  • 刊出日期:  2024-08-22

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