摘要:
本文根据硅雪崩光电二极管(Si-APD)的测试原理,设计了一套计算机测试系统,包括光
源部分、直流偏置扫描电源、二进制权电阻器、XF-01选频放大器、A/D,D/A接口转换器和
JS-10小型计算机.文中对设计的合理性、使用的可靠性及测试误差进行了分析和讨论.实
践证明,该测试系统能满足计算机自动测试Si-APD直流或低频参数的要求.
Abstract:
In this paper, based on the principles of the measurement of parameters of silicon
avalanche photo diodes, the design of a practical testinging system is presented. The
system includes light source, d-c scanning bias power supply, the binary-weighted
resistors, XF-O1 frequencyseleetive amplifier, A/D and D/A converters, and a
minicomputer. Rationality of the design, reliability of the system in operation, and the
accuracy of measurement are discussed. It has been proved that the requirements of the
automatic measurement of Si-APD d-c parameters with a computer are well satisfied.
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