Abstract: The unification of syntactic and statistical approach has been investigated so as to get an officient metrod for pattern recognition. In this paper, based on the work done by the author, and referred to a point of view in cognitive psychology, the recognition of line drawing patterns is discussed. The trade off between syntax and semantics in high dimensional attributed grammar is shown by an example. In addition, the distance measures of syntax, semantics, and relationships between chunks are also given for line drawing pattern recognition. As a matter of fact, the minimum distance criterion can be applied for line drawing pattern (especially for Chinese character) recognition.